Static information storage and retrieval – Read/write circuit – Precharge
Reexamination Certificate
2008-05-20
2008-05-20
Phung, Anh (Department: 2824)
Static information storage and retrieval
Read/write circuit
Precharge
C365S200000, C365S218000
Reexamination Certificate
active
10561965
ABSTRACT:
A semiconductor memory device having a dummy memory cell and a reading method of the same, wherein provision is made of a memory cell11connected to a word line WL and a pair of bit lines BL and xBL, a dummy memory cell12connected to a word line WL and a pair of dummy bit lines DBL and xDBL, and a word line driver13for activating the word line at a common timing, and when the data is read out from the memory cell, a timing of the reading of the data is determined in accordance with a level of the dummy bit lines connected to the dummy memory, and when a voltage difference of a pair of dummy bit lines becomes a threshold voltage, the word line driver deactivates the word line and precharges the dummy bit lines.
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International Search Report mailed Nov. 16, 2004.
Kananen Ronald P.
Nguyen Hien N
Phung Anh
Rader & Fishman & Grauer, PLLC
Sony Corporation
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