Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2007-03-20
2007-03-20
Hoang, Quoc (Department: 2818)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C438S620000, C257S382000, C257SE21440, C257SE21653
Reexamination Certificate
active
11004420
ABSTRACT:
The present invention relates to a semiconductor memory device and a method for fabricating the same. The semiconductor memory device, including: a plurality of gate structures formed on a substrate; a contact junction region formed beneath the substrate disposed in lateral sides of the respective gate structures; a trench formed by etching a portion of the substrate disposed in the contact junction region with a predetermined thickness; a dopant diffusion barrier layer formed on sidewalls of the trench; and a contact plug filled into a space created between the gate structures and inside of the trench, wherein the dopant diffusion barrier layer prevents dopants within the contact plug from diffusing out.
REFERENCES:
patent: 5429978 (1995-07-01), Lu et al.
patent: 2005/0040490 (2005-02-01), Park
Cheong Jung-Taik
Kim Dong-sauk
Kim Seung-Bum
Hoang Quoc
Hynix / Semiconductor Inc.
Townsend and Townsend / and Crew LLP
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