Static information storage and retrieval – Systems using particular element – Flip-flop
Reexamination Certificate
2007-04-03
2007-04-03
Phan, Trong (Department: 2827)
Static information storage and retrieval
Systems using particular element
Flip-flop
C365S156000, C365S226000
Reexamination Certificate
active
10733270
ABSTRACT:
When threshold voltages of constituent transistors are reduced in order to operate an SRAM circuit at a low voltage, there is a problem in that a leakage current of the transistors is increased and, as a result, electric power consumption when the SRAM circuit is not operated while storing data is increased. Therefore, there is provided a technique for reducing the leakage current of MOS transistors in SRAM memory cells MC by controlling a potential of a source line ssl of the driver MOS transistors in the memory cells.
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Osada Kenichi
Yamaoka Masanao
Yanagisawa Kazumasa
Mattingly ,Stanger ,Malur & Brundidge, P.C.
Phan Trong
Renesas Technology Corp.
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