Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2007-04-17
2007-04-17
Nguyen, Cuong (Department: 2811)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S351000, C257S369000
Reexamination Certificate
active
11052036
ABSTRACT:
A semiconductor device includes a silicon substrate, a channel region formed in a surface of the silicon substrate, a gate insulating film formed on the channel region, a gate electrode formed on the gate insulating film, first gate side walls formed on the gate insulating film to sandwich the gate electrode in a gate length direction, second gate side walls which sandwich the gate electrode and the first gate side wall, first diffused layers formed on the surface of the silicon substrate to sandwich the channel region, second diffused layers which sandwich the channel region and the first diffused layer and have a larger depth than that of the first diffused layer, and low resistance layers which are formed between the first diffused layer and the second gate side wall and contain nitride, boride or carbide of Ti, Zr, Hf or Ta.
REFERENCES:
patent: 6909145 (2005-06-01), Cabral et al.
patent: 6977415 (2005-12-01), Matsuo
patent: 7135724 (2006-11-01), Chen et al.
patent: 11-297991 (1999-10-01), None
Kamimuta Yuuichi
Koyama Masato
Nishiyama Akira
Kabushiki Kaisha Toshiba
Nguyen Cuong
Oblon & Spivak, McClelland, Maier & Neustadt P.C.
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