Semiconductor memory apparatus and test method thereof

Details Semiconductor memory apparatus and test method thereof Semiconductor memory apparatus and test method thereof

2011-08-30

2011-08-30

Nguyen, Tan T. (Department: 2827)

Static information storage and retrieval

Read/write circuit

Testing

C365S149000, C365S190000, C365S207000

Reexamination Certificate

active

08009493

ABSTRACT:
A semiconductor memory apparatus includes a bit line pair electrically connected to a memory cell and a bit line sense amplifier for detecting and amplifying voltage levels of the bit line pair. The semiconductor memory apparatus is configured to perform a test to determine the occurrence of leakage current by deactivating the bit line sense amplifier and applying a test voltage to the bit line pair when the semiconductor memory apparatus is in test mode.

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