4. Static information storage and retrieval
  5. Read/write circuit
  6. Testing

Eun Sung Na

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Semiconductor memory apparatus and test method thereof

Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate

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Semiconductor memory apparatus having a sub-word line driver...

Static information storage and retrieval – Addressing – Particular decoder or driver circuit
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2263716

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