Semiconductor memory and data read method of the same

Static information storage and retrieval – Read/write circuit – Precharge

Reexamination Certificate

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C365S230060

Reexamination Certificate

active

11297380

ABSTRACT:
A semiconductor memory having memory cells each storing first data and second data in a memory cell array arranged in a column direction; a plurality of word lines connected to the memory cells in a row direction; and first and second bit lines, to which the first and second data are respectively read out, in the column direction. When one of the first and second bit lines changes from a first potential to a second potential lower than the first potential after data read out, the potential of the other bit line is changed from the second to the first potential, and if the electric potential of the selected bit line changes from the first to the second potential when data is read out, the other bit line is selected when the data is next read out, and, if the electric potential of the selected bit line maintains the first potential, the selected bit line is maintained selected even when the data is to be read out next.

REFERENCES:
patent: 5295099 (1994-03-01), Kagami
patent: 5836007 (1998-11-01), Clinton et al.
patent: 5946251 (1999-08-01), Sato et al.
patent: 5966319 (1999-10-01), Sato
patent: 6366492 (2002-04-01), Kawasumi
patent: 6898100 (2005-05-01), Kohno
patent: 11-53886 (1999-02-01), None

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