Semiconductor integrated circuit with a test circuit for input b

Details Semiconductor integrated circuit with a test circuit for input b Semiconductor integrated circuit with a test circuit for input b

1995-07-31

1997-05-27

Hudspeth, David R.

Electronic digital logic circuitry

With test facilitating feature

326 21, 371 226, H03K 19003

Patent

active

056335997

ABSTRACT:
In a semiconductor integrated circuit provided with a circuit for testing an input buffer threshold voltage, an output node of a first logic gate having its output logic value determined by an output signal of an input buffer, and an output node of a second logic gate having its output logic value determined by a condition setting signal from an external source, are connected to a common signal line. When a standardized voltage for discriminating the threshold voltage is applied to the input buffer, if the input buffer malfunctions, the output signal of the first logic gate collides with the output signal of the second logic gate on the common signal line, so that a power supply current greatly increases.

REFERENCES:
patent: Re34916 (1995-04-01), Sweeney
patent: 5077521 (1991-12-01), Langford, II et al.
patent: 5369645 (1994-11-01), Pritchard et al.
patent: 5371712 (1994-12-01), Oguchi et al.
patent: 5392298 (1995-02-01), Shinjo
patent: 5495487 (1996-02-01), Whetsel, Jr.

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