Semiconductor integrated circuit with a test circuit

Details Semiconductor integrated circuit with a test circuit Semiconductor integrated circuit with a test circuit

2007-10-30

2007-10-30

Britt, Cynthia (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S729000

Reexamination Certificate

active

10649765

ABSTRACT:
A shift scan chain includes logic circuit blocks11-18and scan registers21-28connected at stages succeeding them. The shift chain is divided into divisional chains including the scan registers21-24and the scan registers25-28.In the test operation mode of a semiconductor integrated circuit, test input data TI are supplied in synchronism with a multiplied clock signal CKD at a frequency twice of that of a clock signal CK. The test input data TI are converted by a serial/parallel conversion circuit40into parallel data S41and S42,which are respectively supplied to the head scan registers21and25of the corresponding divisional chains. The length of each divisional chains becomes ½, and a test time period can be shortened.

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Philips, 74HC/HCT166 8-bit parallel-in/serial-out shift register Dec. 1990, Philips Semiconductor, pp. 4-6.

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