Semiconductor integrated circuit including operation test...

Details Semiconductor integrated circuit including operation test... Semiconductor integrated circuit including operation test...

2006-11-07

2006-11-07

Chung, Phung My (Department: 2138)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S707000

Reexamination Certificate

active

07134060

ABSTRACT:
A semiconductor integrated circuit disclosed herein comprising: a phase control circuit which shifts a phase of a first clock signal based on a phase control signal and outputs a second clock signal; a first flip-flop to which one of the first clock signal and the second clock signal is inputted as a first operation clock signal, and which outputs evaluation data; a circuit under test which performs a predetermined process based on the evaluation data and outputs a result of the process as output data; and a second flip-flop to which the other of the first clock signal and the second clock signal is inputted as a second operation clock signal and the output data is inputted, and which outputs the output data inputted from the circuit under test.

REFERENCES:
patent: 5671260 (1997-09-01), Yamauchi et al.
patent: 6114890 (2000-09-01), Okajima et al.
patent: 6597747 (2003-07-01), Azuma
patent: 7023946 (2006-04-01), Sawada et al.
patent: 10-339769 (1998-12-01), None

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