Semiconductor integrated circuit including a power...

Details Semiconductor integrated circuit including a power... Semiconductor integrated circuit including a power...

2010-02-04

2011-10-11

Chang, Daniel D (Department: 2819)

Electronic digital logic circuitry

With test facilitating feature

C714S726000, C326S062000

Reexamination Certificate

active

08035411

ABSTRACT:
Provided is a semiconductor integrated circuit capable of testing power control operation in the semiconductor integrated circuit including a power controllable region. Power control switches have switch series each constituted by a plurality of switch cells. A power controllable region includes output nodes in the switch series. The output nodes output power control signals that have passed through final stages of the respective switch series of the power control switches to the outside of the power controllable region. A chip on which the semiconductor integrated circuit is mounted has output terminals that output outputs of the output nodes to the outside of the chip. In the case of inserting a scan path test, observation flip-flops that load the outputs of the output nodes to data terminals, and load scan data to scan-in terminals are disposed in correspondence with the respective output nodes. Those observation flip-flops are connected to constitute a scan path chain.

REFERENCES:
patent: 7002834 (2006-02-01), Yokozeki
patent: 7042245 (2006-05-01), Hidaka
patent: 7263640 (2007-08-01), Kobayashi
patent: 7310795 (2007-12-01), Tsukamoto
patent: 2006-170663 (2006-06-01), None

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