Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2008-07-29
2008-07-29
Britt, Cynthia (Department: 2117)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
C365S194000, C365S225700, C365S201000, C714S741000, C714S037000
Reexamination Certificate
active
10860051
ABSTRACT:
A semiconductor integrated circuit device which guarantees the characteristics of writing to and reading from the built-in memory even when the manufacturing process conditions are varied, a method of manufacturing the device, and a medium for storing a processing procedure for deciding the number of delay circuits built in the device used for designing. The semiconductor integrated circuit device is provided with a cache memory which includes a BIST circuit composed of a pattern generator, a pattern comparator, an output register, a register controlled by a register control a register write signal; a variable delay circuit controlled by the register; word lines, and a sense amplifier enable signal line. The timing for enabling the sense amplifier is changed and the memory is measured by a BIST circuit at the timing, thereby deciding the optimal timing.
REFERENCES:
patent: 5251172 (1993-10-01), Yamauchi
patent: 5327381 (1994-07-01), Johnson et al.
patent: 5596538 (1997-01-01), Joo
patent: 5615169 (1997-03-01), Leung
patent: 5764577 (1998-06-01), Johnston et al.
patent: 5909404 (1999-06-01), Schwarz
patent: 5956350 (1999-09-01), Irrinki et al.
patent: 5963721 (1999-10-01), Shiell et al.
patent: 6011709 (2000-01-01), Tanaka et al.
patent: 6011734 (2000-01-01), Pappert
patent: 6085334 (2000-07-01), Giles et al.
patent: 6151692 (2000-11-01), Smitlener et al.
patent: 6154861 (2000-11-01), Harward
patent: 6226766 (2001-05-01), Harward
patent: 6295593 (2001-09-01), Hsu et al.
patent: 6333706 (2001-12-01), Cummings et al.
patent: 6343366 (2002-01-01), Okitaka
patent: 6560740 (2003-05-01), Zuraski et al.
patent: 6625688 (2003-09-01), Fruehling et al.
patent: 2002/0077782 (2002-06-01), Fruehling et al.
patent: A 2-91900 (1990-03-01), None
patent: A 7-021776 (1995-01-01), None
J. Schütz et al.: A 450MHz IA32 P6 Family Microprocessor, ISSCC98 15 /Microprocessors/Paper FP 15.4, Jan. 1998 IEEE International Solid-State Circuits Conference, pp. 236-237.
Honmura Tetsuro
Ishibashi Koichiro
Osada Kenichi
Yano Kazuo
Britt Cynthia
Renesas Technology Corporation
LandOfFree
Semiconductor integrated circuit device, method of... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Semiconductor integrated circuit device, method of..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor integrated circuit device, method of... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3906029