Electronic digital logic circuitry – With test facilitating feature
Reexamination Certificate
2010-02-12
2010-11-30
Chang, Daniel D (Department: 2819)
Electronic digital logic circuitry
With test facilitating feature
C326S038000, C714S726000
Reexamination Certificate
active
07843210
ABSTRACT:
A disclosed semiconductor integrated circuit device includes a logic circuit, a memory circuit to which data are written by the logic circuit and from which the data are read by the logic circuit, a register circuit holding the data when the logic circuit writes the data to the memory circuit, and a selector circuit selecting one of data output from the register circuit and data output from the memory circuit, and outputting the selected data to the logic circuit. Further in the semiconductor integrated circuit device, in an operational test of the logic circuit, the selector circuit selects the data output from the register circuit and outputs the selected data to the logic circuit.
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patent: 1-267475 (1989-10-01), None
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patent: 11-3243 (1999-01-01), None
patent: 11-101858 (1999-04-01), None
International Search Report for PCT/JP2007/068257, mailed on Dec. 4, 2007.
Chang Daniel D
Fujitsu Limited
Staas & Halsey , LLP
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