Semiconductor integrated circuit device and manufacturing...

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S637000, C438S643000, C438S653000, C438S687000, C438S692000

Reexamination Certificate

active

06849535

ABSTRACT:
A semiconductor device comprises a semiconductor substrate; a first insulating film overlying a surface of the semiconductor substrate, an upper surface of the first insulating film being nitrided; a first copper-embedded interconnection embedded in the first insulating film, and which first copper-embedded interconnection contains copper as a main component; a copper nitride film overlying an upper surface of the first copper-embedded interconnection; a cap insulating film overlying an upper surface of the first insulating film and an upper surface of the copper nitride film; and a second insulting film overlying the cap insulating film.

REFERENCES:
patent: 3837929 (1974-09-01), Caule
patent: 4910169 (1990-03-01), Hoshino
patent: 5281304 (1994-01-01), Kadomura
patent: 5391517 (1995-02-01), Gelatos et al.
patent: 5447887 (1995-09-01), Filipiak et al.
patent: 5677244 (1997-10-01), Venkatraman
patent: 5693563 (1997-12-01), Teong
patent: 5744376 (1998-04-01), Chan et al.
patent: 5814557 (1998-09-01), Venkatraman et al.
patent: 5818110 (1998-10-01), Cronin
patent: 6016000 (2000-01-01), Moslehi
patent: 6043153 (2000-03-01), Nogami et al.
patent: 6048789 (2000-04-01), Vines et al.
patent: 6068879 (2000-05-01), Pasch
patent: 6083840 (2000-07-01), Mravic et al.
patent: 6117775 (2000-09-01), Kondo et al.
patent: 6136680 (2000-10-01), Lai et al.
patent: 6143658 (2000-11-01), Donnelly, Jr. et al.
patent: 6146135 (2000-11-01), Watanabe et al.
patent: 6153043 (2000-11-01), Edelstein et al.
patent: 6159857 (2000-12-01), Liu et al.
patent: 6165894 (2000-12-01), Pramanick et al.
patent: 6171957 (2001-01-01), Mackawa
patent: 6174810 (2001-01-01), Islam et al.
patent: 6181012 (2001-01-01), Edelstein et al.
patent: 6191007 (2001-02-01), Matsui et al.
patent: 6207552 (2001-03-01), Wang et al.
patent: 6242349 (2001-06-01), Nogami et al.
patent: 6326299 (2001-12-01), Homma et al.
patent: 6348402 (2002-02-01), Kawanoue et al.
patent: 6355571 (2002-03-01), Huang et al.
patent: 6376345 (2002-04-01), Ohashi et al.
patent: 6509273 (2003-01-01), Imai et al.
patent: 6521532 (2003-02-01), Cunningham
patent: 6596637 (2003-07-01), Schonauer et al.
patent: 20010030367 (2001-10-01), Noguchi et al.
patent: 20020027287 (2002-03-01), Takagi et al.
patent: 20020042193 (2002-04-01), Noguchi et al.
patent: 0 508 156 (1992-10-01), None
patent: 5-47735 (1993-02-01), None
patent: 6-37038 (1994-02-01), None
patent: 6-224194 (1994-08-01), None
patent: 6-283520 (1994-10-01), None
patent: 7-135192 (1995-05-01), None
patent: 9-82798 (1997-03-01), None
patent: 9-306915 (1997-11-01), None
patent: 10-56014 (1998-02-01), None
patent: 10-261715 (1998-09-01), None
patent: 11-16912 (1999-01-01), None
patent: 11-87353 (1999-03-01), None
patent: 11-135466 (1999-05-01), None
patent: 11-251317 (1999-09-01), None
patent: 11-330246 (1999-11-01), None
patent: 2000-150435 (2000-05-01), None
patent: 2001-298009 (2001-10-01), None
B. Luther et al., “Planar Copper-Polyimide Back End of the Line Interconnections for ULSI Devices”, VMIC Conference 1993 ISMIC-102/93/0015, Jun. 8-9, 1993, pp. 15-21.
J. Noguchi et al., “TDDB Improvement in Cu Metallization under Bias Stress”, IEEE 38thAnnual International Reliability Physics Symposium, 2000, pp. 339-343.
S. Matsushita, “The Lighting in Clean Rooms Induces the Corrosion of Copper: Hitachi Announces the Mechanism for Photo-Corrosion”, Semiconductor FPD World, Jul. 2000, pp. 69-73 (translation attached).
Y. Homma et al., “Control of Photocorrosion in the Copper Damascene Process”, Journal of the Electrochemical Society, 147 (3), 2000, pp. 1193-1198.
T. Ohmura et al., “CMP Device ‘SP4000’”, Electronic Materials, May 1996, pp. 53-55 (translation attached).
M. Tsujimura, “Clean CMP System”, Electronic Materials, May 1996, pp. 62-65 (tranlation attached).
Y. Hirakura, “CMC Device ‘Avanti-472’”, Electronic Materials, May 1996, pp. 33-35 (translation attached).
T. Kawane, “Etching Low-k Films—Improving Resistance to Heat and O2Plasma is the Key to Succesfully Applying Organic Films to the Cu-Damascene Process”, Semiconductor World, Nov. 1998, pp. 74-76 (translation attached).
U.S. Appl. No. 09/646,671, Uno et al., filed Jun. 21, 2000.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Semiconductor integrated circuit device and manufacturing... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor integrated circuit device and manufacturing..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor integrated circuit device and manufacturing... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3460678

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.