Electronic digital logic circuitry – With test facilitating feature
Reexamination Certificate
2006-07-18
2006-07-18
Chang, Daniel (Department: 2819)
Electronic digital logic circuitry
With test facilitating feature
C714S726000, C327S270000
Reexamination Certificate
active
07078928
ABSTRACT:
The present invention provides a semiconductor integrated circuit device equipped with at least one pulse generator which generates a pulse of a pulse with shorter than a rising time up to the full amplitude of a transfer signal.A first signal and a second signal supplied from outside through a first signal path and a second signal path are respectively transferred to the pulse generator. When a rising time up to the full amplitude at any one of buffers in the first signal path and the second signal path is longer than a pulse width of a pulse to be formed by the pulse generator, the difference in phase between the first signal and the second signal is caused to correspond to a pulse width of a first pulse.
REFERENCES:
patent: 5783960 (1998-07-01), Lackey
patent: 6452435 (2002-09-01), Skergan et al.
patent: 7-84011 (1995-03-01), None
patent: 2001-91590 (2001-04-01), None
Kurita Kozaburo
Kusunoki Mitsugu
Sahara Ryusuke
Sakakibara Hideki
Suzuki Yuuji
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