Electronic digital logic circuitry – Signal sensitivity or transmission integrity – Signal level or switching threshold stabilization
Reexamination Certificate
2008-07-08
2008-07-08
Tran, Anh Q (Department: 2819)
Electronic digital logic circuitry
Signal sensitivity or transmission integrity
Signal level or switching threshold stabilization
C326S017000, C326S112000, C326S119000
Reexamination Certificate
active
07397271
ABSTRACT:
A semiconductor integrated circuit device has a combinational logic circuit including one or plural logic cells connected in series. At least one of the logic cells has: a standard cell which includes a MIS transistor, the standard cell including an input terminal to which an output signal from a previous stage is inputted as an input signal and an output terminal, and the standard cell performing a predetermined logic operation based on the input signal and outputting a result of the logic operation as an output signal from the output terminal; a first conductivity-type first MIS transistor which is provided between the output terminal of the standard cell and a first power supply voltage, the first MIS transistor including a control terminal to which a circuit control signal is inputted, and the first MIS transistor supplying the first power supply voltage to the output terminal of the standard cell based on the circuit control signal in order to bring the standard cell into an operation-stopped state; and a second conductivity-type second MIS transistor which is provided between the standard cell and a second power supply voltage, the second MIS transistor including a control terminal to which the circuit control signal is inputted, and the second MIS transistor cutting off a leakage current of the MIS transistor in the standard cell based on the circuit control signal in order to bring the standard cell into the operation-stopped state.
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Furusawa Toshiyuki
Hamada Mototsugu
Nishikawa Tsuyoshi
Kabushiki Kaisha Toshiba
Oblon & Spivak, McClelland, Maier & Neustadt P.C.
Tran Anh Q
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