Semiconductor integrated circuit and testing method for the...

Details Semiconductor integrated circuit and testing method for the... Semiconductor integrated circuit and testing method for the...

2007-03-27

2007-03-27

Chiang, Jack (Department: 2825)

Computer-aided design and analysis of circuits and semiconductor

Nanotechnology related integrated circuit design

C716S030000

Reexamination Certificate

active

10187413

ABSTRACT:
A semiconductor integrated circuit of the present invention is provided with a clock control portion having a clock generation portion for generating a clock signal and an output command signal input portion for receiving a clock output command signal from the outside, and an internal circuit controlled by an output clock signal that is output from the clock control portion, and the clock control portion is configured so that it outputs the output clock signal to the internal circuit when a certain time period has passed from a time when the output command signal is received.

REFERENCES:
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patent: 6318911 (2001-11-01), Kitahara
patent: 6442722 (2002-08-01), Nadeau-Dostie et al.
patent: 6457167 (2002-09-01), Kitahara
patent: 6532560 (2003-03-01), Miyake
patent: 6651224 (2003-11-01), Sano et al.
patent: 6718523 (2004-04-01), Hathaway et al.
patent: 2003/0018939 (2003-01-01), Kinoshita et al.

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