Semiconductor integrated circuit

Details Semiconductor integrated circuit Semiconductor integrated circuit

2006-06-06

2006-06-06

Decady, Albert (Department: 2138)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Memory testing

C714S733000, C365S201000

Reexamination Certificate

active

07058863

ABSTRACT:
A semiconductor integrated circuit including a region of a memory macro function block is divided into memory core function block and interface function block regions. The interface function block includes a test circuit, a command decoder for a test, an address decoder for the test, a memory core input/output circuit which inputs a command and address into the memory core function block and transmits!receives data with the memory core function block, a configuration memory block in which information of a memory capacity of the memory core function block and configuration of a memory core is stored, and a configuration memory block which controls a data path and address path of the memory core function block based on the stored information.

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