Active solid-state devices (e.g. – transistors – solid-state diode – Heterojunction device – With lattice constant mismatch
Reexamination Certificate
2007-02-08
2009-06-09
Pert, Evan (Department: 2826)
Active solid-state devices (e.g., transistors, solid-state diode
Heterojunction device
With lattice constant mismatch
C257SE29193, C257SE21086
Reexamination Certificate
active
07544976
ABSTRACT:
A semiconductor heterostructure that includes a support substrate with a first in-plane lattice parameter, a buffer structure formed on the support substrate and having on top in a relaxed state a second in-plane lattice parameter, and a multi-layer stack of ungraded layers formed on the buffer structure. This semiconductor hetero-structure possess a lower surface roughness than other heterostructures. In the heterostructure, the ungraded layers are strained layers that comprise at least one strained smoothing layer of a semiconductor material having in a relaxed state a third in-plane lattice parameter which has a value between the first and the second lattice parameter.
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G. Abstreiter, “Semiconductor Heterostructures”, 8173 Siemens Forschungs—und Entwicklungsberichte, vol. 15, No. 6, pp. 312-318 (1986).
Aulnette Cécile
Figuet Christophe
Pert Evan
S.O.I.Tec Silicon on Insulator Technologies
Wilson Scott R
Winston & Strawn LLP
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