Semiconductor devices including channel and junction regions...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

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C257S368000, C257SE29113, C257S349000

Reexamination Certificate

active

07859064

ABSTRACT:
A semiconductor device may include a substrate, an active semiconductor region of the substrate, and a gate electrode. The active semiconductor region may include a channel region between first and second junction regions. The channel region may include a first semiconductor material, the first and second junction regions may include a second semiconductor material, and the first and second semiconductor materials may be different. The gate electrode may be on the channel region with portions of the first and second junction regions being free of the gate electrode.

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patent: 6413802 (2002-07-01), Hu et al.
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patent: 2003/0201458 (2003-10-01), Clark et al.
patent: 2005/0224889 (2005-10-01), Oh et al.
T. Ghani et al;A 90nm High Volume Manufacturing Logic Technology Featuring Novel 45nm Gate Length Strained Silicon CMOS Transistors, Proceedings of the 2003 International Election Devices Meeting.
T. Ghani et al;A 90nm High Volume Manufacturing Logic Technology Featuring Novel 45nm Gate Length Strained Silicon CMOS Transistors, Proceedings of the 2003 International Election Devices Meeting (SLIDES).
Korean Office Action for Korean Patent Application No. 10-2004-0058785 mailed on Feb. 28, 2006.

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