Semiconductor devices having ZQ calibration circuits and...

Details Semiconductor devices having ZQ calibration circuits and... Semiconductor devices having ZQ calibration circuits and...

2011-06-28

2011-06-28

Tan, Vibol (Department: 2819)

Electronic digital logic circuitry

Signal sensitivity or transmission integrity

Bus or line termination

C326S086000, C327S108000

Reexamination Certificate

active

07969182

ABSTRACT:
Provided is a semiconductor device for performing a calibration operation without an external ZQ calibration command and a calibration method thereof. The semiconductor device includes a calibration circuit for performing a pull-down calibration operation in response to a pull-down calibration enable signal and a command control unit for generating the pull-down calibration enable signal in response to a DLL reset signal. The calibration method includes adjusting an impedance of a first pull-up resistance structure in response to pull-up calibration codes having a default value. A pull-down calibration enable signal may be generated in response to a DLL reset signal. A voltage of the first node and a reference voltage are compared by a comparator. The comparator outputs pull-down calibration codes based on the comparison. An impedance of a pull-down resistance structure is adjusted, so a resistance of the pull-down resistance structure is equal to a resistance of the first pull-up resistance structure.

REFERENCES:
patent: 6570402 (2003-05-01), Koo et al.
patent: 6714465 (2004-03-01), Jang
patent: 6812732 (2004-11-01), Bui
patent: 7782079 (2010-08-01), Park
patent: 2006-203405 (2006-08-01), None
patent: 10-2004-0083814 (2004-10-01), None
patent: 10-2007-0044790 (2007-04-01), None
patent: 10-0853466 (2008-08-01), None

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