Semiconductor devices having elongated contact plugs

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

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C257S306000, C257S758000

Reexamination Certificate

active

07547938

ABSTRACT:
A method of manufacturing a semiconductor device includes forming conductive structures on a substrate. Each of the conductive structures has a line shape that extends along a first direction parallel to the substrate. Insulating spacers are formed on upper sidewalls of the conductive structures. An insulating interlayer is formed that covers the conductive structures. A portion of the insulating interlayer between the conductive structures is etched to form a contact hole. An upper portion of the contact hole is larger than a lower portion thereof. The upper portion of the contact hole has a first width along the first direction and a second width along a second direction parallel to the substrate and substantially perpendicular to the first direction. The first width is substantially larger than the second width. The contact hole is filled with a conductive material to form a contact plug.

REFERENCES:
patent: 5248628 (1993-09-01), Okabe et al.
patent: 5622883 (1997-04-01), Kim
patent: 6472268 (2002-10-01), Yoo
patent: 6586794 (2003-07-01), Nakamura et al.
patent: 6713337 (2004-03-01), Takahashi
patent: 6794757 (2004-09-01), Smith
patent: 7030439 (2006-04-01), Yun et al.
patent: 10-2000-0013396 (2000-03-01), None
patent: 10-2003-0023970 (2003-03-01), None
patent: 10-2003-0041550 (2003-05-01), None
Notice to Submit a Response for Korean Application No. 10-2004-0022737, Dec. 9, 2005.

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