Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2007-11-20
2007-11-20
Pham, Thanhha S. (Department: 2813)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S774000, C257SE23145
Reexamination Certificate
active
11419719
ABSTRACT:
According to embodiments of the invention, a bit line interlayer insulating layer is placed over a semiconductor substrate. Two adjacent bit line patterns are placed in parallel on the bit line interlayer insulating layer and each of the two adjacent bit line patterns includes a bit line and a bit line capping layer pattern stacked thereon. A buried contact interlayer insulating layer covers a surface of the semiconductor substrate having the two adjacent bit line patterns. A contact hole is placed in a portion between the bit line patterns to penetrate the buried contact interlayer insulating layer and the bit line interlayer insulating layer and to expose at least one side wall of the bit line patterns. A contact hole spacer covers side wall of the contact hole. A contact hole plug is placed on the contact hole spacer to fill the contact hole.
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English language abstract of Korean Publication No. 2002-0002680.
Jeong Sang-Moo
Kim Seong-Goo
Marger & Johnson & McCollom, P.C.
Pham Thanhha S.
Samsung Electronics Co,. Ltd.
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