Semiconductor device manufacturing: process – Chemical etching – Combined with coating step
Reexamination Certificate
2007-06-26
2010-06-22
Wilczewski, Mary (Department: 2822)
Semiconductor device manufacturing: process
Chemical etching
Combined with coating step
C438S701000, C438S637000, C438S638000, C438S340000, C438S270000, C438S277000, C438S259000, C257S296000, C257SE29200, C257SE29201, C257SE21545, C257SE21549
Reexamination Certificate
active
07741223
ABSTRACT:
A method for fabricating a semiconductor device includes etching a substrate to form a first recess having a micro trench, etching the substrate disposed under the first recess to form a second recess having a profile substantially vertical and a width greater than a portion of the first recess where no micro trench is formed, etching the substrate disposed under the second recess to form a third recess having a profile substantially spherical, and forming a gate pattern over a resultant recess including the first to third recesses.
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Han Ky-Hyun
Park Hyun-Sik
Green Telly D
Hynix / Semiconductor Inc.
Lowe Hauptman & Ham & Berner, LLP
Wilczewski Mary
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