Semiconductor device with a field stop zone and process of...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

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C257S362000, C257SE29027

Reexamination Certificate

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07989888

ABSTRACT:
Embodiments discussed herein relate to processes of producing a field stop zone within a semiconductor substrate by implanting dopant atoms into the substrate to form a field stop zone between a channel region and a surface of the substrate, at least some of the dopant atoms having energy levels of at least 0.15 eV below the energy level of the conduction band edge of semiconductor substrate; and laser annealing the field stop zone.

REFERENCES:
patent: 7361970 (2008-04-01), Barthelmess et al.
patent: 7514750 (2009-04-01), Mauder et al.
patent: 2008/0283868 (2008-11-01), Schulze et al.

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