4. Static information storage and retrieval
  5. Read/write circuit
  6. Bad bit

Junko Ogino

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Fault repair method for a memory device

Static information storage and retrieval – Read/write circuit – Bad bit
Patent

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Semiconductor device test apparatus and method

Error detection/correction and fault detection/recovery – Pulse or data error handling – Replacement of memory spare location – portion – or segment
Reexamination Certificate

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Profile ID: LFUS-PAI-P-1253210

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