Semiconductor device manufacturing method using oxygen...

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – Insulated gate formation

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C257S635000, C257SE21192, C257SE29132

Reexamination Certificate

active

07833891

ABSTRACT:
A semiconductor device and method is provided that has an oxygen diffusion barrier layer between a high-k dielectric and BOX. The method includes depositing a diffusion barrier layer on a BOX layer and gate structure and etching a portion of the diffusion barrier layer from sidewalls of the gate structure. The method further includes depositing a high-k dielectric on the diffusion barrier layer and the gate structure.

REFERENCES:
patent: 5436186 (1995-07-01), Hsue et al.
patent: 5457065 (1995-10-01), Huang et al.
patent: 5460999 (1995-10-01), Hong et al.
patent: 5716884 (1998-02-01), Hsue et al.
patent: 6403434 (2002-06-01), Yu
patent: 6495437 (2002-12-01), Yu
patent: 6524920 (2003-02-01), Yu
patent: 6534395 (2003-03-01), Werkhoven et al.
patent: 6551885 (2003-04-01), Yu
patent: 6660660 (2003-12-01), Haukka et al.
patent: 6703708 (2004-03-01), Werkhoven et al.
patent: 6756277 (2004-06-01), Yu
patent: 6787424 (2004-09-01), Yu
patent: 6933225 (2005-08-01), Werkhoven et al.
patent: 7067360 (2006-06-01), Lee
patent: 7071122 (2006-07-01), Saenger et al.
patent: 7105390 (2006-09-01), Brask et al.
patent: 7176483 (2007-02-01), Grupp et al.
patent: 7193279 (2007-03-01), Doyle et al.
patent: 7241653 (2007-07-01), Hareland et al.
patent: 7241674 (2007-07-01), Chan et al.
patent: 7268058 (2007-09-01), Chau et al.
patent: 7279375 (2007-10-01), Radosavljevic et al.
patent: 7304336 (2007-12-01), Cheng et al.
patent: 7326634 (2008-02-01), Lindert et al.
patent: 7326656 (2008-02-01), Brask et al.
patent: 7329913 (2008-02-01), Brask et al.
patent: 7348284 (2008-03-01), Doyle et al.
patent: 7358121 (2008-04-01), Chau et al.
patent: 7361958 (2008-04-01), Brask et al.
patent: 2001/0041250 (2001-11-01), Werkhoven et al.
patent: 2002/0115252 (2002-08-01), Haukka et al.
patent: 2005/0142738 (2005-06-01), Lee
patent: 2006/0043421 (2006-03-01), Doris et al.
patent: 2008/0070366 (2008-03-01), Doris et al.
patent: 2009/0039426 (2009-02-01), Cartier et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Semiconductor device manufacturing method using oxygen... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor device manufacturing method using oxygen..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor device manufacturing method using oxygen... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4214451

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.