Semiconductor device includes gate insulating film having a...

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – Insulated gate formation

Reexamination Certificate

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C438S216000, C438S287000, C438S585000, C257SE21207, C257SE21260, C257SE21268

Reexamination Certificate

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07396748

ABSTRACT:
A semiconductor device comprising a semiconductor substrate and a MOSFET provided on the semiconductor substrate, the MOSFET including a gate insulating film and a gate electrode provided on the gate insulating film, wherein the gate insulating film has a higher dielectric constant in a side contacting the semiconductor substrate than in a side contacting the gate electrode.

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Yudong Kim, et al. “Conventional n-channel MOSFET devices using single layer HfO2and ZrO2as high-k gate dielectrics with polysilicon gate electrode”, IEDM, 01-455, pp. 455-458, Dec. 2, 2001.

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