Semiconductor device having sufficient process margin and...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C257S903000, C257SE27098, C430S311000

Reexamination Certificate

active

10892588

ABSTRACT:
According to some embodiments of the invention, a substrate doped with a P type impurity is provided. An N type impurity is doped into the substrate to divide the substrate into a P type impurity region and an N type impurity region. Active patterns having a first pitch are formed in the P type and N type impurity regions. Gate patterns having a second pitch are formed on the active patterns in a direction substantially perpendicular to the active patterns. Other embodiments are described and claimed.

REFERENCES:
patent: 6483136 (2002-11-01), Yoshida et al.
patent: 6791200 (2004-09-01), Nii
patent: 10-209298 (1998-08-01), None
patent: 2002-26125 (2002-01-01), None
patent: 1999-0074949 (1999-10-01), None
patent: 2001-0010407 (2001-02-01), None
English language abstract of Korean Publication No. 2001-0010407.
English language abstract of Japanese Publication No. 10-209298.
English language abstract of Korean Publication No. 1999-0074949.
English language abstract of Japanese Publication No. 2002-26125.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Semiconductor device having sufficient process margin and... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor device having sufficient process margin and..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor device having sufficient process margin and... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3805440

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.