Static information storage and retrieval – Read/write circuit – Particular read circuit
Reexamination Certificate
2011-04-05
2011-04-05
Dinh, Son (Department: 2824)
Static information storage and retrieval
Read/write circuit
Particular read circuit
C365S189011
Reexamination Certificate
active
07920432
ABSTRACT:
One embodiment includes a non-volatile memory cell array, and a read unit configured to disable read operation for the non-volatile memory cell array for a time period following writing of data in the non-volatile memory cell array.
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Kim Du Eung
Lee Kwang Jin
Lee Yong Jun
Dinh Son
Harness Dickey & Pierce
Nguyen Nam T.
Samsung Electronics Co,. Ltd.
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