Static information storage and retrieval – Read/write circuit – Particular read circuit
Reexamination Certificate
2011-07-12
2011-07-12
Nguyen, Tuan T. (Department: 2824)
Static information storage and retrieval
Read/write circuit
Particular read circuit
C365S148000, C365S189070, C365S189050
Reexamination Certificate
active
07978539
ABSTRACT:
In one embodiment, the semiconductor device includes a non-volatile memory cell array. Memory cells of the non-volatile memory cell array are resistance based, and each memory cell has a resistance that changes over time after data is written into the memory cell. A write address buffer is configured to store write addresses associated with data being written into the non-volatile memory cell array, and a read unit is configured to perform a read operation to read data from the non-volatile memory cell array. The read unit is configured to control a read current applied to the non-volatile memory cell array during the read operation based on whether a read address matches one of the stored write addresses and at least one indication of settling time of the data being written into the non-volatile memory cell array.
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Choi Byung Gil
Lee Kwang Jin
Harness Dickey & Pierce
Nguyen Tuan T.
Samsung Electronics Co,. Ltd.
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