Semiconductor device having redundancy circuit

Details Semiconductor device having redundancy circuit Semiconductor device having redundancy circuit

2005-06-21

2005-06-21

Elms, Richard (Department: 2824)

Static information storage and retrieval

Read/write circuit

Bad bit

C365S230030, C714S710000, C714S711000

Reexamination Certificate

active

06909647

ABSTRACT:
A semiconductor memory is provided with a defect recovery scheme featuring a redundancy circuit. The memory array in the memory has a plurality of word lines, a plurality of bit lines, a spare bit line, and a plurality of memory cells. The redundancy circuit includes one or more comparing circuits having programmable elements which function as a memory for storing therein a defective address existing in the memory array. The programmable elements of the redundancy circuit can be programmed in accordance with any of a number of different types of defect modes. Each comparing circuit of the redundancy circuit compares information (data) inputted therein, for example, the column and row addresses which may be under the control of an address multiplex system, with that programmed in the programmable elements of the comparing circuit. On the basis of this comparison, an appropriate defect recovery is effected.

REFERENCES:
patent: 4389715 (1983-06-01), Eaton, Jr. et al.
patent: 4648075 (1987-03-01), Segawa et al.
patent: 4656610 (1987-04-01), Yoshida et al.
patent: 4675845 (1987-06-01), Itoh et al.
patent: 4727516 (1988-02-01), Yoshida et al.
patent: 4733372 (1988-03-01), Nanbu et al.
patent: 4752914 (1988-06-01), Nakano et al.
patent: 4837747 (1989-06-01), Dosaka et al.
patent: 4849938 (1989-07-01), Furutani et al.
patent: 5265055 (1993-11-01), Horiguchi et al.
patent: 5617365 (1997-04-01), Horiguchi et al.
patent: 5815448 (1998-09-01), Horiguchi et al.
patent: 6577544 (2003-06-01), Horiguchi et al.
patent: 6754114 (2004-06-01), Horiguchi et al.
patent: 59-135700 (1984-08-01), None
patent: 60-130139 (1985-11-01), None
patent: 62-40700 (1987-02-01), None
IEEE Journal of Solid-State Circuits, vol. SC-16, No. 5, Oct. 1981, pp. 479-487.
IEEE PROC., vol. 130, Pt. I, No. 3, Jun. 1983, pp. 127-135.
1984 IEEE International Solid-State Circuits Conference, Digest of Technical Papers, pp. 282-283.
IEEE Journal of Solid-State Circuits, vol. 26, No. 1, Jan. 1991, pp. 12-17.
“System for Efficiently Using Spare Memory Components for Defect Corrections Employing Content-Addressable Memory.” IBM Technical Disclosure Bulletin, vol. 28, No. 6, Nov. 1985, pp. 2562-2567.

Affiliated with

Also associated with

Rating

Semiconductor device having redundancy circuit does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor device having redundancy circuit, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor device having redundancy circuit will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3461601