Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2011-05-31
2011-05-31
Arora, Ajay K (Department: 2892)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S133000, C257S146000, C257SE29027, C438S135000
Reexamination Certificate
active
07952143
ABSTRACT:
A semiconductor device in which both an IGBT element region and a diode element region exist in the same semiconductor substrate includes a low lifetime region, which is formed in at least a part of a drift layer within the diode element region and shortens the lifetime of holes. A mean value of the lifetime of holes in the drift layer that includes the low lifetime region is shorter within the IGBT element region than within the diode element region.
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Hisanaga Yukihiro
Soeno Akitaka
Arora Ajay K
Kenyon & Kenyon LLP
Toyota Jidosha & Kabushiki Kaisha
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