Semiconductor device having a strained semiconductor alloy...

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

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C257S190000

Reexamination Certificate

active

07939399

ABSTRACT:
A new technique enables providing a stress-inducing alloy having a highly stress-inducing region and a region which is processable by standard processing steps suitable for use in a commercial high volume semiconductor device manufacturing environment. The regions may be formed by a growth process with a varying composition of the growing material or by other methods such as ion implantation. The highly stress-inducing region near the channel region of a transistor may be covered with an appropriate cover.

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patent: 7605407 (2009-10-01), Wang
patent: 7611951 (2009-11-01), Ueno et al.
patent: 2006/0172511 (2006-08-01), Kammler et al.
patent: 2008/0067545 (2008-03-01), Rhee et al.
patent: 2008/0121929 (2008-05-01), Lai et al.
Foreign Associate Transmittal Letter dated Jan. 21, 2008.
Translation of Official Communication Issued Nov. 22, 2007.

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