Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2006-09-29
2009-11-10
Nguyen, Dao H (Department: 2818)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C438S209000, C438S268000, C438S270000, C438S274000, C257S220000, C257S328000, C257S330000, C257SE21429, C257SE21621
Reexamination Certificate
active
07615449
ABSTRACT:
The semiconductor device having a recess channel transistor includes a device isolation structure formed in a semiconductor substrate to define an active region having a recess region at a lower part of sidewalls thereof and a recess channel region formed in the semiconductor substrate under the active region. A method for fabricating the semiconductor device includes forming a device isolation structure in a semiconductor substrate to form an active region having a recess region at a lower part of sidewalls thereof, a gate insulating film formed over the semiconductor substrate including the recess channel region, and a gate electrode formed over the gate insulating film to fill up the recess channel region.
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Korean Notice of Rejection for App. No. 10-2006-0038825, sent Apr. 24, 2007.
Chung Sung Woong
Lee Sang Don
Hynix / Semiconductor Inc.
Nguyen Dao H
Townsend and Townsend / and Crew LLP
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