Semiconductor device manufacturing: process – With measuring or testing – Electrical characteristic sensed
Reexamination Certificate
2005-01-18
2005-01-18
Whitehead, Jr., Carl (Department: 2813)
Semiconductor device manufacturing: process
With measuring or testing
Electrical characteristic sensed
C438S017000, C324S765010
Reexamination Certificate
active
06844209
ABSTRACT:
A semiconductor device includes a semiconductor chip carrying a plurality of contact electrodes on a principal surface thereof, wherein the contact electrodes are arranged symmetrically about an axis of symmetry according to the types of the contact electrodes.
REFERENCES:
patent: 5212403 (1993-05-01), Nakanishi et al.
patent: 5703402 (1997-12-01), Chu et al.
patent: 5952726 (1999-09-01), Liang
patent: 6140710 (2000-10-01), Greenberg
patent: 6144091 (2000-11-01), Washida
patent: 6225702 (2001-05-01), Nakamura
patent: 6246121 (2001-06-01), Dandia
patent: 6275051 (2001-08-01), Bachelder et al.
patent: 20010024127 (2001-09-01), Bernier et al.
patent: 404030544 (1990-05-01), None
patent: 403099450 (1991-04-01), None
Fujitsu Limited
Jr. Carl Whitehead
Vesperman William C.
Westerman Hattori Daniels & Adrian LLP
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