Semiconductor device having a low thermal budget metal filling a

Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Of specified configuration

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

257750, 257763, 257764, 257770, 257773, 257751, H01L 2348, H01L 2352, H01L 2940

Patent

active

059629231

ABSTRACT:
The present invention pertains to a carrier layer and a contact enabled by the carrier layer which enables the fabrication of aluminum (including aluminum alloys and other conductive materials having a similar melting point) electrical contacts in multilayer integrated circuit vias, through holes, or trenches having an aspect ratio greater than one. In fact, the structure has been shown to enable such contact fabrication in vias, through holes, and trenches having aspect ratios as high as at least 5:1, and should be capable of filing apertures having aspect ratios up to about 12:1. The carrier layer, in addition to permitting the formation of a conductive contact at high aspect ratio, provides a diffusion barrier which prevents the aluminum from migrating into surrounding substrate material which operates in conjunction with the electrical contact. The carrier layer preferably comprises a layer formed by ionizing the flux of sputter deposition maternal partially reacting the flux with a gas, and depositing the resulting material on a substrate.

REFERENCES:
patent: 3437864 (1969-04-01), Kofoid et al.
patent: 3616452 (1971-10-01), Bessot et al.
patent: 3619403 (1971-11-01), Gorin
patent: 3649502 (1972-03-01), Herte et al.
patent: 3699034 (1972-10-01), Lins et al.
patent: 3705091 (1972-12-01), Jacob
patent: 3873884 (1975-03-01), Gabriel
patent: 3875068 (1975-04-01), Mitzel
patent: 3879597 (1975-04-01), Bersin et al.
patent: 4123316 (1978-10-01), Tsuchimoto
patent: 4233109 (1980-11-01), Nishizawa
patent: 4351712 (1982-09-01), Cuomo et al.
patent: 4362632 (1982-12-01), Jacob
patent: 4368092 (1983-01-01), Steinberg et al.
patent: 4421592 (1983-12-01), Shuskus et al.
patent: 4431898 (1984-02-01), Reinberg et al.
patent: 4431901 (1984-02-01), Hull
patent: 4668338 (1987-05-01), Maydan et al.
patent: 4668365 (1987-05-01), Foster et al.
patent: 4686113 (1987-08-01), Delfino et al.
patent: 4716491 (1987-12-01), Ohno et al.
patent: 4810935 (1989-03-01), Boswell
patent: 4844775 (1989-07-01), Keeble
patent: 4849675 (1989-07-01), Muller
patent: 4859908 (1989-08-01), Yoshida et al.
patent: 4911814 (1990-03-01), Matsuoka et al.
patent: 4918031 (1990-04-01), Flamm et al.
patent: 4948458 (1990-08-01), Ogle
patent: 4951601 (1990-08-01), Maydan et al.
patent: 4990229 (1991-02-01), Campbell et al.
patent: 4999096 (1991-03-01), Nihei et al.
patent: 5018479 (1991-05-01), Markunas et al.
patent: 5108570 (1992-04-01), Wang
patent: 5146137 (1992-09-01), Gesche et al.
patent: 5171412 (1992-12-01), Talieh et al.
patent: 5178739 (1993-01-01), Barnes et al.
patent: 5186718 (1993-02-01), Tepman et al.
patent: 5225740 (1993-07-01), Ohkawa
patent: 5231334 (1993-07-01), Paranjpe
patent: 5240880 (1993-08-01), Hindman et al.
patent: 5338423 (1994-08-01), Hindman et al.
patent: 5354443 (1994-10-01), Moslehi
patent: 5358616 (1994-10-01), Ward
patent: 5371042 (1994-12-01), Ong
patent: 5378660 (1995-01-01), Ngan et al.
patent: 5397962 (1995-03-01), Moslehi
patent: 5406123 (1995-04-01), Narayan
patent: 5430355 (1995-07-01), Paranjpe
patent: 5435881 (1995-07-01), Ogle
patent: 5514908 (1996-05-01), Liao et al.
patent: 5525837 (1996-06-01), Choudhury
patent: 5565708 (1996-10-01), Ohsaki et al.
patent: 5658828 (1997-08-01), Lin et al.
Pramanik et al., "Barrier Metals for ULSI: Deposition and Manufacturing," Solid State Technology, Jan., 1993, pp. 73-76,78,79,82.
Kim et al., "The effect of reactive-sputtered TiN on electromigration of Al alloy metallization", Proceedings IEEE VMIC Conference, Jun. 27-29, 1995 (104/95/0443), P.443.
Campbell et al., Relationship Between Texture and Electromigration Lifetime in Sputtered Al-1% Si Thin films, Journal of Electronic Materials, vol. 22, 1993 pp. 589-596.
Kordic et al., "Correlation between stress voiding of AL(Si)(Cu) metallizations and crystal orientation of aluminum grains," Journal of Applied Physics, vol. 74, 1993, pp. 5391-5394.
Hopwood et al., "Langmuir probe measurements of a radio frequency induction plasma," Journal of Vacuum Science and Technology A, vol. 11, 1993, pp. 152-156.
Knorr et al., "The role of texture in the electromigration behavior in pure aluninum films," Journal of Applied Physics, vol. 79, 1996, pp. 2409-2417.
Macalpine and Schildknecht, Coaxial Resonators with Helical Inner Conductor, Dec. 1959 Issue of Proceedings of the IRE, pp. 2099-2105.
Aston, Kaufman, Wilbur, Ion Beam Divergence Characteristics of Two-Grid Accelerator Systems, May 1978 AIAA Journal vol. 16, #5 pp. 516-524.
Sakudo, Tokiguchi, Koike, Kanomata, Microwave ion source, Jul. 1977 Review of Scientific Instruments vol. 48, #7 pp. 762-766.
Matsuzawa, Itoh, Ishikawa, Yanagida, Direct anodization of GaAs and Si at extremely low substrate temperature by low pressure oxygen plasma, Jul./Aug. 1980 Journal of Vacuum Science & Technology, pp. 793-795.
Takuo Sugano, Ed., Applications of Plasma Processes to VLSI Technology, 1982-1985.
Boswell, Porteous, Prytz, Bouchoule, Ranson, Some Features of RF Excited Fully Ionized Low Pressure Argon Plasma, Sep. 6, 1982 Physics Letters Vo. 91A #4, pp. 163-166.
Rossnagel, Directional And Ionized Sputter Deposition For Microelectronics Applications, 1995 Proc. of the 3rd ISSP, pp. 253-260.
Rossnagel, Filling dual damascene interconnect structures with AICu and Cu using ionized magnetron deposition, Jan./Feb. 1995 Journal of Vacuum Science & Technology B, Vl. 13 #1, pp. 125-129.
Peter Burggraaf, Ed., Straightening Out Sputter Despostion, Aug. 1995 Semiconductor International, pp. 69,70,72,74.
S. N. Mei et al., "Nonconformal A1 via filling and planariation by partially ionized beam depostion for multilevel interconnection", I.E.E.E. Electron Device Letters, EDL-8, No. 10, pp. 503-505 (Oct. 1987).
S. M. Rossnagel and J. Hopwood, "Metal ion deposition from ionized magnetron sputtering discharge", J. Vac. Sci. Technol. B, vol. 12, No. 1, pp. 449-453, Dec. 1994.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Semiconductor device having a low thermal budget metal filling a does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor device having a low thermal budget metal filling a, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor device having a low thermal budget metal filling a will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1174760

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.