Semiconductor device having a fully silicided gate electrode...

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

Reexamination Certificate

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C438S664000, C438S655000, C438S649000, C438S669000, C438S721000, C438S583000, C438S300000, C438S230000, C438S618000, C438S744000, C438S791000, C438S199000, C257S536000, C257SE21166

Reexamination Certificate

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07148143

ABSTRACT:
The present invention provides a semiconductor device, a method of manufacture therefor, and a method for manufacturing an integrated circuit. The semiconductor device (100), among other possible elements, includes a silicided gate electrode (150) located over a substrate (110), the silicided gate electrode (150) having gate sidewall spacers (160) located on sidewalls thereof. The semiconductor device (100) further includes source/drain regions (170) located in the substrate (110) proximate the silicided gate electrode (150), and silicided source/drain regions (180) located in the source/drain regions (170) and at least partially under the gate sidewall spacers (160).

REFERENCES:
patent: 6326291 (2001-12-01), Yu
patent: 6391710 (2002-05-01), Moore et al.
patent: 6794313 (2004-09-01), Chang
patent: 2001/0034129 (2001-10-01), Moore et al.
patent: 2004/0259303 (2004-12-01), Lee et al.
patent: 2005/0179098 (2005-08-01), Chan et al.

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