Semiconductor device, data element thereof and method of...

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

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Details

C438S237000, C438S396000, C257S324000, C257SE21334, C257SE29308

Reexamination Certificate

active

07981742

ABSTRACT:
A method of fabricating a semiconductor device is provided. The method comprises: (a) providing a first and a second conductor; (b) providing a conductive layer; (c) forming a part of the conductive layer into a data storage layer by a plasma oxidation process, wherein the data storage layer is positioned between the first and the second conductor.

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English language translation of abstract of CN 1574363 (published Feb. 2, 2005).
English language translation of abstract of CN 101174672 (published May 7, 2008).
Chinese language office action dated Apr. 1, 2011.
English language translation of abstract of CN 101079395 (published Nov. 28, 2007).

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