Semiconductor device controlling debug operation of...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Details

C714S030000

Reexamination Certificate

active

07917818

ABSTRACT:
A semiconductor device includes a volatile memory for storing a first instruction group, a first processing unit for executing the first instruction group, a nonvolatile memory for storing a second instruction group, a second processing unit for executing a second instruction group, a control signal output unit for outputting a control signal to specify permission or prohibition of executing a debugging function to the first processing unit, and a debug control unit for controlling execution of the debugging function by the first processing unit based on the control signal.

REFERENCES:
patent: 5625785 (1997-04-01), Miura et al.
patent: 6553506 (2003-04-01), Hijikata et al.
patent: 6954878 (2005-10-01), Kudo
patent: 7185244 (2007-02-01), Kojima et al.
patent: 7401257 (2008-07-01), Usui
patent: 7437623 (2008-10-01), Larson et al.
patent: 7584381 (2009-09-01), Kudo
patent: 2003-186693 (2003-07-01), None

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