Semiconductor device capable of testing a transmission line...

Details Semiconductor device capable of testing a transmission line... Semiconductor device capable of testing a transmission line...

2011-08-09

2011-08-09

Tan, Vibol (Department: 2819)

Electronic digital logic circuitry

Signal sensitivity or transmission integrity

Bus or line termination

C326S086000

Reexamination Certificate

active

07994813

ABSTRACT:
A semiconductor device includes a plurality of pads, where an external reference resistor is connected to a first one of the pads, an impedance calibrating unit configured to generate an impedance calibration code corresponding to an impedance of the reference resistor and output the impedance calibration code to a code transmitting line during a normal operating mode, and an impedance matching unit configured to perform an impedance matching operation in response to the impedance calibration code during the normal operating mode. The impedance calibrating unit is configured to output a test code to the code transmitting line in response to a test signal during a test operating mode. The impedance matching unit is configured to serialize the test code to output the serialized test code to each of the other pads in response to the test signal during the test operating mode.

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