Semiconductor device and soldering portion inspecting method the

Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Flip chip

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

257779, 257780, 257786, H01L 2348

Patent

active

059145366

ABSTRACT:
A semiconductor device includes a wiring board having a main surface and a plurality of pad electrodes formed on the main surface, a rectangular semiconductor element having a main surface facing the main surface of the wiring board and mounted on the main surface of the wiring board, a solder resist formed to surround the semiconductor element with a preset distance therefrom on the main surface of the wiring board, a plurality of terminal electrodes formed on the end portion of the main surface of the semiconductor element, and a plurality of solder bumps for electrically connecting the plurality of pad electrodes to the plurality of terminal electrodes with a gap provided between the main surface of the wiring board and the main surface of the semiconductor element, wherein each of the plurality of pad electrodes includes at least a portion which extends from substantially under a corresponding one of the plurality of terminal electrodes of the semiconductor element to the solder resist lying outside the semiconductor element and each of the plurality of solder bumps includes a portion extending over part of a corresponding one of the plurality of pads which lies outside the semiconductor element.

REFERENCES:
patent: 3303393 (1967-02-01), Hymes et al.
patent: 3871014 (1975-03-01), King et al.
L.F. Miller "Microelectronic Device Standoffs " IBM Technical Disclosure Bulletin vol. 8. No. 3 Aug. 1965.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Semiconductor device and soldering portion inspecting method the does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor device and soldering portion inspecting method the, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor device and soldering portion inspecting method the will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1709762

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.