Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
Reexamination Certificate
2007-11-01
2010-06-01
Smith, Bradley K (Department: 2894)
Semiconductor device manufacturing: process
Coating with electrically or thermally conductive material
To form ohmic contact to semiconductive material
C438S612000
Reexamination Certificate
active
07727876
ABSTRACT:
A flip chip semiconductor device has a substrate with a plurality of active devices formed thereon. A contact pad is formed on the substrate in electrical contact with the plurality of active devices. A passivation layer is formed over the substrate and intermediate conduction layer. An adhesive layer is formed over the passivation layer. A barrier layer is formed over the adhesive layer. A wetting layer is formed over the barrier layer. The barrier layer and wetting layer in a first region are removed, while the barrier layer, wetting layer, and adhesive layer in a second region are maintained. The adhesive layer over the passivation layer in the first region are maintained until the solder bumps are formed. By keeping the adhesive layer over the passivation layer until after formation of the solder bumps, less cracking occurs in the passivation layer.
REFERENCES:
patent: 6989326 (2006-01-01), Tong et al.
patent: 7112523 (2006-09-01), Horng
patent: 2002/0180064 (2002-12-01), Hwan et al.
patent: 2004/0188378 (2004-09-01), Wu et al.
patent: 2004/0256734 (2004-12-01), Farnworth et al.
Cao Haijing
Lin Yaojian
Zhang Qing
Atkins Robert D.
Smith Bradley K
STATS ChipPAC Ltd.
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