Semiconductor device and method of manufacturing thereof

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C257S402000, C257S404000, C257S408000

Reexamination Certificate

active

10806610

ABSTRACT:
This invention is characterized in that, a gate electrode27F formed on a P-type well3via a gate oxide film9, a high-concentration N-type source layer and a high-concentration N-type drain layer15respectively formed apart from the gate electrode and a low-concentration N-type source layer and a low-concentration N-type drain layer respectively formed so that they respectively surround the N-type source layer and the N-type drain layer10and respectively parted by a P-type body layer formed under the gate electrode27F are provided.

REFERENCES:
patent: 4062699 (1977-12-01), Armstrong
patent: 4948745 (1990-08-01), Pfiester et al.
patent: 5517046 (1996-05-01), Hsing et al.
patent: 5567629 (1996-10-01), Kubo
patent: 5576574 (1996-11-01), Hong
patent: 5688700 (1997-11-01), Kao et al.
patent: 5814858 (1998-09-01), Williams
patent: 5844272 (1998-12-01), Soderbarg et al.
patent: 5926712 (1999-07-01), Chen et al.
patent: 6033944 (2000-03-01), Shida
patent: 6060362 (2000-05-01), Rhee
patent: 6242787 (2001-06-01), Nakayama et al.
patent: 6259136 (2001-07-01), Kawaguchi et al.
patent: 6635925 (2003-10-01), Taniguchi et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Semiconductor device and method of manufacturing thereof does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor device and method of manufacturing thereof, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor device and method of manufacturing thereof will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3807285

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.