Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2007-05-29
2007-05-29
Crane, Sara (Department: 2811)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S402000, C257S404000, C257S408000
Reexamination Certificate
active
10806610
ABSTRACT:
This invention is characterized in that, a gate electrode27F formed on a P-type well3via a gate oxide film9, a high-concentration N-type source layer and a high-concentration N-type drain layer15respectively formed apart from the gate electrode and a low-concentration N-type source layer and a low-concentration N-type drain layer respectively formed so that they respectively surround the N-type source layer and the N-type drain layer10and respectively parted by a P-type body layer formed under the gate electrode27F are provided.
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Aoyama Masashige
Arai Takashi
Taniguchi Toshimitsu
Crane Sara
Gebremariam Samuel A.
Sanyo Electric Co,. Ltd.
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