Semiconductor device and method of manufacturing the same

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C257S310000, C257S751000, C257SE21170, C257SE21006, C257SE21021, C257SE21304, C257SE21585

Reexamination Certificate

active

11344550

ABSTRACT:
Provided are a semiconductor device including a reliable interconnect and a method of manufacturing the same. The semiconductor device includes a substrate, an inter-metal dielectric (IMD) pattern having an opening, an amorphous metallic nitride layer formed on the inner surface of the opening, a diffusion barrier layer formed on the amorphous metallic nitride layer, and a conductive layer filled into the opening having the diffusion barrier layer.

REFERENCES:
patent: 6413858 (2002-07-01), Chopra
patent: 6479898 (2002-11-01), Hopper et al.
patent: 6538324 (2003-03-01), Tagami et al.
patent: 6545357 (2003-04-01), Chopra
patent: 6893541 (2005-05-01), Chiang et al.
patent: 7041595 (2006-05-01), Chopra
patent: 2001-007204 (2001-01-01), None
patent: 1998-060592 (1998-10-01), None
patent: 2003-0001103 (2003-01-01), None
patent: 2003-0048618 (2003-06-01), None
patent: 2004-0007111 (2004-01-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Semiconductor device and method of manufacturing the same does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor device and method of manufacturing the same, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor device and method of manufacturing the same will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3936534

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.