Semiconductor device and method of manufacturing the same

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

Reexamination Certificate

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C438S624000

Reexamination Certificate

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07144804

ABSTRACT:
A semiconductor device comprises a semiconductor substrate, an interlayer insulating film including a first insulating film formed above the substrate and having a relative dielectric constant smaller than 2.5 and a second insulating film formed to cover the first insulating film and having a relative dielectric constant larger than that of the first insulating film, and a buried wiring formed within the interlayer insulating film. A bottom portion of the second insulating film is buried in the first insulating film at a number of points.

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patent: 6281113 (2001-08-01), Maeda
patent: 6498384 (2002-12-01), Marathe
patent: 6864583 (2005-03-01), Matsunaga et al.
patent: 7045379 (2006-05-01), Tanabe et al.
patent: 2-130828 (1990-05-01), None
patent: 6-112204 (1994-04-01), None
patent: 2000-100944 (2000-04-01), None
patent: 2000-294634 (2000-10-01), None
patent: 2001-316222 (2001-11-01), None
patent: 2001-358218 (2001-12-01), None
People's Republic of China Patent Office Notification of the First Office Action and English translation thereof, Feb. 18, 2005.

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