Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2008-12-23
2011-11-08
Richards, N Drew (Department: 2895)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C438S238000, C438S243000, C438S253000, C438S257000, C438S259000, C257SE21639
Reexamination Certificate
active
08053313
ABSTRACT:
In a method of fabricating a semiconductor device on a substrate having a pillar pattern, a gate electrode is formed on the pillar pattern without etching the latter. A conductive pattern is filled between adjacent pillar patterns, a spacer is formed above the conductive pattern and surrounding sidewalls of each pillar pattern, and the gate electrode is formed by etching the conductive pattern using the spacer as an etch barrier.
REFERENCES:
patent: 6150688 (2000-11-01), Maeda et al.
patent: 6426259 (2002-07-01), Yu
patent: 6610575 (2003-08-01), Ang et al.
patent: 7122425 (2006-10-01), Chance et al.
patent: 2004/0115884 (2004-06-01), Wang
patent: 2005/0048711 (2005-03-01), Wang
patent: 2005/0156202 (2005-07-01), Rhee et al.
patent: 2007/0190766 (2007-08-01), Seo et al.
patent: 10-0660881 (2006-12-01), None
patent: 1020090098208 (2009-09-01), None
Korean Notice of Allowance for Korean application No. 10-2008-0030173.
Office Action dated Jul. 14, 2010, for Chinese application No. 200910129370.4.
Cho Yun-Seok
Jung Young-Kyun
Lee Chun-Hee
Park Sang-Hoon
Hynix / Semiconductor Inc.
Lee Kyoung
Lowe Hauptman & Ham & Berner, LLP
Richards N Drew
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