Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2011-08-09
2011-08-09
Malsawma, Lex (Department: 2892)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
Reexamination Certificate
active
07994013
ABSTRACT:
A semiconductor device comprises a gate electrode on a semiconductor substrate, drift regions at opposite sides of the gate electrode, source and drain regions in the respective drift regions, and shallow trench isolation (STI) regions in the respective drift regions between the gate electrode and the source or drain region, wherein the drift regions comprise first and second conductivity-type impurities.
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patent: 1926690 (2007-03-01), None
Huang Chih-Feng Yang; “Isolated High-Voltage LDMOS Transistor Having a Split Well Structure”; esp@cenet; Chinese Publication No. CN1926690 (A); Publication Date: Mar. 7, 2007; esp@cenet Database—Worldwide.
Partial Chinese Office Action date stamped Jul. 24, 2009; Chinese Patent Application No. 2008101248935; The State Intellectual Property Office of P.R.C., People's Republic of China.
Kim Jong Min
Yoo Jae Hyun
Dongbu Hi-Tek Co., Ltd.
Fortney Andrew D.
Jimenez Anthony R.
Malsawma Lex
The Law Offices of Andrew D. Fortney
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