Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2004-09-28
2008-11-11
Britt, Cynthia (Department: 2112)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
C714S718000, C714S729000, C714S724000
Reexamination Certificate
active
07451368
ABSTRACT:
A packaged semiconductor device that enables testing of semiconductor chips incorporated therein in a simplified and efficient manner. The semiconductor device includes a packaged logic chip for processing data and a packaged memory chip for storing data that is processed by or that is to be processed by the logic circuit. The semiconductor device has an automatic rewrite circuit and a selector. The automatic rewrite circuit automatically writes test data to the memory circuit in accordance with a command signal from a tester. The selector selectively switches between accessing of the memory circuit by the automatic rewrite circuit and accessing of the memory circuit by the logic circuit. The tester provides the automatic rewrite circuit with a test start command signal to start testing the logic circuit.
REFERENCES:
patent: 4931997 (1990-06-01), Mitsuishi et al.
patent: 5084843 (1992-01-01), Mitsuishi et al.
patent: 6006313 (1999-12-01), Fukumoto
patent: 6009547 (1999-12-01), Jaquette et al.
patent: 6708302 (2004-03-01), Shibayama et al.
patent: 2003/0043612 (2003-03-01), Ishikawa
Patent Abstracts of Japan, Publication No. 2003-077296, Publication Date: Mar. 14, 2003, Title: “Semiconductor Device which Incorporates Memory Chip and Logic Chip, and in which Test of Memory Chip can be Performed”.
Shibata Sigenori
Suzuki Takayuki
Watanabe Tomofumi
Yoshikawa Sadao
Alphonse Fritz
Britt Cynthia
Occhiuti Rohlicek & Tsao LLP
Sanyo Electric Co,. Ltd.
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