Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2006-10-10
2006-10-10
Wilczewski, Mary (Department: 2822)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C438S303000, C438S305000, C438S406000, C438S407000, C438S423000
Reexamination Certificate
active
07118978
ABSTRACT:
A method for producing a semiconductor device with an SOI substrate having a support substrate1and a semiconductor layer3that interpose a first insulating film2between them includes the following steps. An element region and an element-separation region4are formed in the semiconductor layer3. A gate insulating film5is formed on the semiconductor layer3. A gate electrode6is formed on the gate insulating film5. A second insulating film7is formed. The gate insulating film5is removed. First thickness adjustment is performed. Ion implantation introducing low concentration impurities is performed on the thickness-adjusted semiconductor layers3and8. A first sidewall portion7ais formed on the side surfaces of the gate electrode6. A second sidewall portion10ais formed on the side surfaces of the first sidewall portion7a.
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Oki Electric Industry Co. Ltd.
Shinjyu Global IP
Thomas Toniae M.
Wilczewski Mary
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